X. Blasco

	2005
4		X. Blasco, M. Nafría, X. Aymerich, J. Pétry, Wilfried Vandervorst: Breakdown spots of ultra-thin (EOT<1.5nm) HfO2/SiO2 stacks observed with enhanced - CAFM. Microelectronics Reliability 45(5-6): 811-814 (2005)
	2002
3		X. Blasco, M. Nafría, X. Aymerich: Conduction and Breakdown Behaviour of Atomic Force Microscopy Grown SiO2 Gate Oxide on MOS Structures. Microelectronics Reliability 42(9-11): 1513-1516 (2002)
	2001
2		M. Porti, X. Blasco, M. Nafría, X. Aymerich, Alexander Olbrich, Bernd Ebersberger: Local current fluctuations before and after breakdown of thin SiO2 films observed with conductive atomic force microscope. Microelectronics Reliability 41(7): 1041-1044 (2001)
1		D. Hill, X. Blasco, M. Porti, M. Nafría, X. Aymerich: Characterising the surface roughness of AFM grown SiO2 on Si. Microelectronics Reliability 41(7): 1077-1079 (2001)

Coauthor Index

1	X. Aymerich	[1] [2] [3] [4]
2	Bernd Ebersberger	[2]
3	D. Hill	[1]
4	M. Nafría	[1] [2] [3] [4]
5	Alexander Olbrich	[2]
6	J. Pétry	[4]
7	M. Porti	[1] [2]
8	Wilfried Vandervorst	[4]

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