R. D. (Shawn) Blanton

Ronald D. Blanton

	2012
89		R. D. (Shawn) Blanton, Wing Chiu Tam, Xiaochun Yu, Jeffrey E. Nelson, Osei Poku: Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations. IEEE Design & Test of Computers 29(1): 36-47 (2012)
88		Yen-Tzu Lin, Osei Poku, R. D. (Shawn) Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar: Physically-Aware N-Detect Test. IEEE Trans. on CAD of Integrated Circuits and Systems 31(2): 308-321 (2012)
87		Wing Chiu Tam, R. D. (Shawn) Blanton: SLIDER: Simulation of Layout-Injected Defects for Electrical Responses. IEEE Trans. on CAD of Integrated Circuits and Systems 31(6): 918-929 (2012)
	2011
86		Bill Eklow, R. D. (Shawn) Blanton: 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011 IEEE 2011
85		Wing Chiu Tam, R. D. (Shawn) Blanton: To DFM or not to DFM? DAC 2011: 65-70
84		Xiaochun Yu, R. D. (Shawn) Blanton: Statistical defect-detection analysis of test sets using readily-available tester data. ICCAD 2011: 768-773
83		Wing Chiu Tam, R. D. (Shawn) Blanton: Physically-aware analysis of systematic defects in integrated circuits. ITC 2011: 1-10
82		Wing Chiu Tam, Ronald D. Blanton: SLIDER: A fast and accurate defect simulation framework. VTS 2011: 172-177
81		Sounil Biswas, Ronald D. Blanton: Reducing Test Execution Cost of Integrated, Heterogeneous Systems Using Continuous Test Data. IEEE Trans. on CAD of Integrated Circuits and Systems 30(1): 148-158 (2011)
80		Wangyang Zhang, Xin Li, Frank Liu, Emrah Acar, Rob A. Rutenbar, Ronald D. Blanton: Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 30(12): 1814-1827 (2011)
79		Yen-Tzu Lin, R. D. (Shawn) Blanton: METER: Measuring Test Effectiveness Regionally. IEEE Trans. on CAD of Integrated Circuits and Systems 30(7): 1058-1071 (2011)
	2010
78		Jeffrey E. Nelson, Wing Chiu Tam, Ronald D. Blanton: Automatic classification of bridge defects. ITC 2010: 305-314
77		Wing Chiu Tam, Osei Poku, Ronald D. Blanton: Systematic defect identification through layout snippet clustering. ITC 2010: 378-387
76		Xiaochun Yu, Ronald D. Blanton: Estimating defect-type distributions through volume diagnosis and defect behavior attribution. ITC 2010: 664-673
75		Wing Chiu Tam, R. D. (Shawn) Blanton, Wojciech Maly: Evaluating yield and testing impact of sub-wavelength lithography. VTS 2010: 200-205
74		Xiaochun Yu, Ronald D. Blanton: Diagnosis of Integrated Circuits With Multiple Defects of Arbitrary Characteristics. IEEE Trans. on CAD of Integrated Circuits and Systems 29(6): 977-987 (2010)
	2009
73		Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton: Automated failure population creation for validating integrated circuit diagnosis methods. DAC 2009: 708-713
72		Xin Li, Rob A. Rutenbar, R. D. (Shawn) Blanton: Virtual probe: A statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits. ICCAD 2009: 433-440
71		Yen-Tzu Lin, Ronald D. Blanton: Test effectiveness evaluation through analysis of readily-available tester data. ITC 2009: 1-10
70		Xiaochun Yu, Yen-Tzu Lin, Wing Chiu Tam, Osei Poku, Ronald D. Blanton: Controlling DPPM through Volume Diagnosis. VTS 2009: 134-139
69		Yen-Tzu Lin, Chukwuemeka U. Ezekwe, Ronald D. Blanton: Physically-Aware N-Detect Test Relaxation. VTS 2009: 197-202
68		Sounil Biswas, Ronald D. Blanton: Maintaining Accuracy of Test Compaction through Adaptive Re-learning. VTS 2009: 257-263
	2008
67		Xiaochun Yu, R. D. (Shawn) Blanton: Multiple defect diagnosis using no assumptions on failing pattern characteristics. DAC 2008: 361-366
66		Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton: Precise failure localization using automated layout analysis of diagnosis candidates. DAC 2008: 367-372
65		Jason G. Brown, Brian Taylor, Ronald D. Blanton, Larry T. Pileggi: Automated Testability Enhancements for Logic Brick Libraries. DATE 2008: 480-485
64		Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D. Blanton: Physically-Aware N-Detect Test Pattern Selection. DATE 2008: 634-639
63		Jason G. Brown, R. D. (Shawn) Blanton: Automated Standard Cell Library Analysis for Improved Defect Modeling. ISQED 2008: 643-648
62		Sounil Biswas, Ronald D. Blanton: Improving the Accuracy of Test Compaction through Adaptive Test Update. ITC 2008: 1
61		Xiaochun Yu, Ronald D. Blanton: An Effective and Flexible Multiple Defect Diagnosis Methodology Using Error Propagation Analysis. ITC 2008: 1-9
60		Yen-Tzu Lin, Osei Poku, Ronald D. Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar: Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon. ITC 2008: 1-9
59		Sounil Biswas, R. D. (Shawn) Blanton: Test Compaction for Mixed-Signal Circuits Using Pass-Fail Test Data. VTS 2008: 299-308
	2007
58		Osei Poku, Ronald D. Blanton: Delay defect diagnosis using segment network faults. ITC 2007: 1-10
57		Sounil Biswas, Peng Li, R. D. (Shawn) Blanton, Larry T. Pileggi: Specification Test Compaction for Analog Circuits and MEMS CoRR abs/0710.4719: (2007)
56		Jason G. Brown, R. D. (Shawn) Blanton: A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology. J. Electronic Testing 23(2-3): 131-144 (2007)
	2006
55		Jeffrey E. Nelson, Jason G. Brown, Rao Desineni, R. D. (Shawn) Blanton: Multiple-detect ATPG based on physical neighborhoods. DAC 2006: 1099-1102
54		Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton: Extraction of defect density and size distributions from wafer sort test results. DATE 2006: 913-918
53		Rao Desineni, Osei Poku, Ronald D. Blanton: A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior. ITC 2006: 1-10
52		Naresh K. Bhatti, Ronald D. Blanton: Diagnostic Test Generation for Arbitrary Faults. ITC 2006: 1-9
51		Jason G. Brown, R. D. (Shawn) Blanton: Exploiting Regularity for Inductive Fault Analysis. VTS 2006: 364-369
50		Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer: Extracting Defect Density and Size Distributions from Product ICs. IEEE Design & Test of Computers 23(5): 390-400 (2006)
49		Sounil Biswas, Ronald D. Blanton: Statistical Test Compaction Using Binary Decision Trees. IEEE Design & Test of Computers 23(6): 452-462 (2006)
48		Ronald D. Blanton, Kumar N. Dwarakanath, Rao Desineni: Defect Modeling Using Fault Tuples. IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2450-2464 (2006)
47		Tao Jiang, R. D. (Shawn) Blanton: Inductive fault analysis of surface-micromachined MEMS. IEEE Trans. on CAD of Integrated Circuits and Systems 25(6): 1104-1116 (2006)
	2005
46		Sounil Biswas, Peng Li, R. D. (Shawn) Blanton, Larry T. Pileggi: Specification Test Compaction for Analog Circuits and MEMS. DATE 2005: 164-169
45		R. D. (Shawn) Blanton, Subhasish Mitra: Testing Nanometer Digital Integration Circuits: Myths, Reality and the Road Ahead. VLSI Design 2005: 8-9
44		Rao Desineni, R. D. (Shawn) Blanton: Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction. VTS 2005: 366-373
	2004
43		Chunsheng Liu, Kumar N. Dwarakanath, Krishnendu Chakrabarty, Ronald D. Blanton: Compact Dictionaries for Diagnosis of Unmodeled Faults in Scan-BIST. ISVLSI 2004: 173-178
42		Jason G. Brown, R. D. (Shawn) Blanton: CAEN-BIST: Testing the NanoFabric. ITC 2004: 462-471
41		Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, Vyacheslav Rovner, S. Tiwary: Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. ITC 2004: 508-517
40		Nilmoni Deb, R. D. (Shawn) Blanton: Multi-Modal Built-In Self-Test for Symmetric Microsystems. VTS 2004: 139-147
39		Sounil Biswas, Kumar N. Dwarakanath, R. D. (Shawn) Blanton: Generalized Sensitization using Fault Tuples. VTS 2004: 297-303
	2003
38		Rahul Kundu, R. D. (Shawn) Blanton: ATPG for Noise-Induced Switch Failures in Domino Logic. ICCAD 2003: 765-769
37		Rahul Kundu, R. D. (Shawn) Blanton: Path Delay Test Generation for Domino Logic Circuits in the Presence of Crosstalk. ITC 2003: 122-130
36		Thomas J. Vogels, Wojciech Maly, R. D. (Shawn) Blanton: Progressive Bridge Identification. ITC 2003: 309-318
35		Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey: Deformations of IC Structure in Test and Yield Learning. ITC 2003: 856-865
34		R. D. (Shawn) Blanton, Kumar N. Dwarakanath, Anirudh B. Shah: Analyzing the Effectiveness of Multiple-Detect Test Sets. ITC 2003: 876-885
33		Ronald D. Blanton, John P. Hayes: On the properties of the input pattern fault model. ACM Trans. Design Autom. Electr. Syst. 8(1): 108-124 (2003)
	2002
32		Nilmoni Deb, R. D. (Shawn) Blanton: Built-In Self Test of CMOS-MEMS Accelerometers. ITC 2002: 1075-1084
31		Ronald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels: Fault Tuples in Diagnosis of Deep-Submicron Circuits. ITC 2002: 233-241
30		Kumar N. Dwarakanath, R. D. (Shawn) Blanton: Exploiting Dominance and Equivalence using Fault Tuples. VTS 2002: 269-274
29		Rahul Kundu, R. D. (Shawn) Blanton: Timed Test Generation Crosstalk Switch Failures in Domino CMOS Circuits. VTS 2002: 379-388
28		Salvador Mir, H. Bederr, R. D. (Shawn) Blanton, Hans G. Kerkhoff, H. J. Klim: SoCs with MEMS? Can We Include MEMS in the SoCs Design and Test Flow? VTS 2002: 449-450
27		Pranab K. Nag, Anne E. Gattiker, Sichao Wei, Ronald D. Blanton, Wojciech Maly: Modeling the Economics of Testing: A DFT Perspective. IEEE Design & Test of Computers 19(1): 29-41 (2002)
26		Keerthi Heragu, Manish Sharma, Rahul Kundu, Ronald D. Blanton: Test vector generation for charge sharing failures in dynamic logic. IEEE Trans. on CAD of Integrated Circuits and Systems 21(12): 1502-1508 (2002)
	2001
25		Ravishankar Arunachalam, Ronald D. Blanton, Lawrence T. Pileggi: False Coupling Interactions in Static Timing Analysis. DAC 2001: 726-731
24		Keerthi Heragu, Manish Sharma, Rahul Kundu, R. D. (Shawn) Blanton: Testing of Dynamic Logic Circuits Based on Charge Sharing. VTS 2001: 396-403
	2000
23		Kumar N. Dwarakanath, Ronald D. Blanton: Universal fault simulation using fault tuples. DAC 2000: 786-789
22		Rahul Kundu, Ronald D. Blanton: Identification of crosstalk switch failures in domino CMOS circuits. ITC 2000: 502-509
21		Nilmoni Deb, Ronald D. Blanton: Analysis of failure sources in surface-micromachined MEMS. ITC 2000: 739-749
20		Rao Desineni, Kumar N. Dwarakanath, Ronald D. Blanton: Universal test generation using fault tuples. ITC 2000: 812-819
19		Noppanunt Utamaphethai, R. D. (Shawn) Blanton, John Paul Shen: Effectiveness of Microarchitecture Test Program Generation. IEEE Design & Test of Computers 17(4): 38-49 (2000)
18		Ronald D. Blanton, John P. Hayes: On the design of fast, easily testable ALU's. IEEE Trans. VLSI Syst. 8(2): 220-223 (2000)
17		Noppanunt Utamaphethai, R. D. (Shawn) Blanton, John Paul Shen: A Buffer-Oriented Methodology for Microarchitecture Validation. J. Electronic Testing 16(1-2): 49-65 (2000)
	1999
16		Tao Jiang, Ronald D. Blanton: Particulate failures for surface-micromachined MEMS. ITC 1999: 329-337
15		Noppanunt Utamaphethai, R. D. (Shawn) Blanton, John Paul Shen: Superscalar Processor Validation at the Microarchitecture Level. VLSI Design 1999: 300-305
14		R. D. (Shawn) Blanton: IDDQ-Testability of Tree Circuits. VLSI Design 1999: 78-86
13		Bernard Courtois, R. D. (Shawn) Blanton: Guest Editors' Introduction. IEEE Design & Test of Computers 16(4): 16-17 (1999)
12		Tamal Mukherjee, Gary K. Fedder, R. D. (Shawn) Blanton: Hierarchical Design and Test of Integrated Microsystems. IEEE Design & Test of Computers 16(4): 18-27 (1999)
	1998
11		Abhijeet Kolpekwar, Ronald D. Blanton, David Woodilla: Failure modes for stiction in surface-micromachined MEMS. ITC 1998: 551-556
10		Abhijeet Kolpekwar, Chris S. Kellen, Ronald D. Blanton: MEMS fault model generation using CARAMEL. ITC 1998: 557-566
	1997
9		Ronald D. Blanton, John P. Hayes: The input pattern fault model and its application. ED&TC 1997: 628
8		Ronald D. Blanton, John P. Hayes: Properties of the Input Pattern Fault Model. ICCD 1997: 372-380
7		Sichao Wei, Pranab K. Nag, Ronald D. Blanton, Anne E. Gattiker, Wojciech Maly: To DFT or Not to DFT? ITC 1997: 557-566
6		Abhijeet Kolpekwar, Ronald D. Blanton: Development of a MEMS Testing Methodology. ITC 1997: 923-931
5		R. D. (Shawn) Blanton, John P. Hayes: Testability Properties of Divergent Trees. J. Electronic Testing 11(3): 197-209 (1997)
	1996
4		Vishwani D. Agrawal, Ronald D. Blanton, Maurizio Damiani: Synthesis of Self-Testing Finite State Machines from High-Level Specifications. ITC 1996: 757-766
3		R. D. (Shawn) Blanton, John P. Hayes: Design of a fast, easily testable ALU. VTS 1996: 9-16
2		Ronald D. Blanton, John P. Hayes: Testability of Convergent Tree Circuits. IEEE Trans. Computers 45(8): 950-963 (1996)
	1993
1		Ronald D. Blanton, John P. Hayes: Efficient Testing of Tree Circuits. FTCS 1993: 176-185

Coauthor Index

1	Emrah Acar	[80]
2	Vishwani D. Agrawal	[4]
3	Ravishankar Arunachalam	[25]
4	H. Bederr	[28]
5	Brady Benware	[50]
6	Naresh K. Bhatti	[52] [64]
7	Sounil Biswas	[39] [46] [49] [57] [59] [62] [68] [81]
8	Jason G. Brown	[41] [42] [50] [51] [54] [55] [56] [63] [65]
9	Krishnendu Chakrabarty	[43]
10	John T. Chen	[31]
11	Bernard Courtois	[13]
12	Maurizio Damiani	[4]
13	Nilmoni Deb	[21] [32] [40]
14	Rao Desineni	[20] [31] [41] [44] [48] [53] [54] [55]
15	Kumar N. Dwarakanath	[20] [23] [30] [31] [34] [39] [43] [48]
16	Bill Eklow (William Eklow)	[86]
17	Chukwuemeka U. Ezekwe	[69]
18	Gary K. Fedder	[12]
19	Y. Fei	[41]
20	Anne E. Gattiker (Anne Gattiker)	[7] [27] [35]
21	Padmini Gopalakrishnan	[41]
22	John P. Hayes	[1] [2] [3] [5] [8] [9] [18] [33]
23	Keerthi Heragu	[24] [26]
24	X. Huang	[41]
25	Vikram Iyengar	[60] [88]
26	Tao Jiang	[16] [47]
27	Chris S. Kellen	[10]
28	Hans G. Kerkhoff	[28]
29	H. J. Klim	[28]
30	Abhijeet Kolpekwar	[6] [10] [11]
31	Rahul Kundu	[22] [24] [26] [29] [37] [38]
32	Peng Li	[46] [57]
33	Xin Li	[72] [80]
34	Yen-Tzu Lin	[60] [64] [69] [70] [71] [79] [88]
35	Chunsheng Liu	[43]
36	Frank Liu	[80]
37	Peter Lloyd	[60] [88]
38	Wojciech Maly	[7] [27] [31] [35] [36] [41] [50] [54] [75]
39	Salvador Mir	[28]
40	Mahim Mishra	[41]
41	Subhasish Mitra	[45]
42	Tamal Mukherjee	[12]
43	Pranab K. Nag	[7] [27]
44	Jeffrey E. Nelson	[41] [50] [54] [55] [78] [89]
45	Phil Nigh	[60] [88]
46	N. Patil	[54]
47	Lawrence T. Pileggi (Larry T. Pileggi, Lawrence T. Pillage)	[25] [46] [57] [65]
48	Osei Poku	[50] [53] [58] [60] [64] [66] [70] [73] [77] [88] [89]
49	Vyacheslav Rovner	[41]
50	Rob A. Rutenbar	[72] [80]
51	Chris Schuermyer	[50]
52	Anirudh B. Shah	[34]
53	Manish Sharma	[24] [26]
54	John Paul Shen	[15] [17] [19]
55	Thomas M. Storey	[35]
56	Wing Chiu Tam	[66] [70] [73] [75] [77] [78] [82] [83] [85] [87] [89]
57	Brian Taylor	[65]
58	S. Tiwary	[41]
59	Noppanunt Utamaphethai	[15] [17] [19]
60	Thomas J. Vogels	[31] [35] [36] [41]
61	Sichao Wei	[7] [27]
62	David Woodilla	[11]
63	Xiaochun Yu	[61] [67] [70] [74] [76] [84] [89]
64	Thomas Zanon	[35] [41] [50] [54]
65	Wangyang Zhang	[80]

Colors in the list of coauthors

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