Steven Bland

	2001
1		Cezary Sydlo, Bastian Mottet, Husin Ganis, Hans L. Hartnagel, Viktor Krozer, S. L. Delage, Simone Cassette, Eric Chartier, D. Floriot, Steven Bland: Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT. Microelectronics Reliability 41(9-10): 1567-1571 (2001)

Coauthor Index

1	Simone Cassette	[1]
2	Eric Chartier	[1]
3	S. L. Delage	[1]
4	D. Floriot	[1]
5	Husin Ganis	[1]
6	Hans L. Hartnagel	[1]
7	Viktor Krozer	[1]
8	Bastian Mottet	[1]
9	Cezary Sydlo	[1]

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