 | 2012 |
|---|
| 10 |       | Sounil Biswas,
Bruce Cory:
An Industrial Study of System-Level Test.
IEEE Design & Test of Computers 29(1): 19-27 (2012) |
| 2011 |
|---|
| 9 | | Sounil Biswas,
Ronald D. Blanton:
Reducing Test Execution Cost of Integrated, Heterogeneous Systems Using Continuous Test Data.
IEEE Trans. on CAD of Integrated Circuits and Systems 30(1): 148-158 (2011) |
| 2009 |
|---|
| 8 | | Sounil Biswas,
Ronald D. Blanton:
Maintaining Accuracy of Test Compaction through Adaptive Re-learning.
VTS 2009: 257-263 |
| 2008 |
|---|
| 7 | | Sounil Biswas,
Ronald D. Blanton:
Improving the Accuracy of Test Compaction through Adaptive Test Update.
ITC 2008: 1 |
| 6 | | Sounil Biswas,
R. D. (Shawn) Blanton:
Test Compaction for Mixed-Signal Circuits Using Pass-Fail Test Data.
VTS 2008: 299-308 |
| 2007 |
|---|
| 5 | | Sounil Biswas,
Peng Li,
R. D. (Shawn) Blanton,
Larry T. Pileggi:
Specification Test Compaction for Analog Circuits and MEMS
CoRR abs/0710.4719: (2007) |
| 2006 |
|---|
| 4 | | Sounil Biswas,
Ronald D. Blanton:
Statistical Test Compaction Using Binary Decision Trees.
IEEE Design & Test of Computers 23(6): 452-462 (2006) |
| 2005 |
|---|
| 3 | | Sounil Biswas,
Peng Li,
R. D. (Shawn) Blanton,
Larry T. Pileggi:
Specification Test Compaction for Analog Circuits and MEMS.
DATE 2005: 164-169 |
| 2004 |
|---|
| 2 | | Sounil Biswas,
Kumar N. Dwarakanath,
R. D. (Shawn) Blanton:
Generalized Sensitization using Fault Tuples.
VTS 2004: 297-303 |
| 2003 |
|---|
| 1 | | Sounil Biswas,
Baquer Mazhari:
A Path Sensitization Technique for Testing of Switched Capacitor Circuits.
VLSI Design 2003: 30-35 |
Data released under the ODC-BY 1.0 license — See also our legal information page