 | 2007 |
|---|
| 6 |       | Alex S. Biewenga,
Frans de Jong:
SiP-test: Predicting delivery quality.
ITC 2007: 1-10 |
| 2006 |
|---|
| 5 | | Frans de Jong,
Alex S. Biewenga:
SiP-TAP: JTAG for SiP.
ITC 2006: 1-10 |
| 2001 |
|---|
| 4 | | F. G. M. de Jong,
Alex S. Biewenga,
D. C. L. van Geest,
T. F. Waayers:
Testing and programming flash memories on assemblies during high volume production.
ITC 2001: 470-479 |
| 1999 |
|---|
| 3 | | Alex S. Biewenga,
Henk D. L. Hollmann,
Frans de Jong,
Maurice Lousberg:
Static component interconnect test technology (SCITT) a new technology for assembly testing.
ITC 1999: 439-448 |
| 1998 |
|---|
| 2 | | Alex S. Biewenga,
Math Muris,
Rodger Schuttert,
Urs Fawer:
Testing a multichip package for a consumer communications application.
ITC 1998: 222-227 |
| 1993 |
|---|
| 1 | | Math Muris,
Alex S. Biewenga:
Using Boundary Scan Test to Test Random Access Memory Clusters.
ITC 1993: 174-179 |
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