Jeanne Bickford

	2010
3		Jeanne Bickford, Nazmul Habib, John Goss, Robert McMahon, Rajiv V. Joshi, Rouwaida Kanj: Use of scalable Parametric Measurement Macro to improve semiconductor technology characterization and product test. ISQED 2010: 315-319
	2006
2		Markus Bühler, Jürgen Koehl, Jeanne Bickford, Jason Hibbeler, Ulf Schlichtmann, R. Sommer, Michael Pronath, Andreas Ripp: DFM/DFY design for manufacturability and yield - influence of process variations in digital, analog and mixed-signal circuit design. DATE 2006: 387-392
1		Jeanne Bickford, Jason Hibbeler, Markus Bühler, Jürgen Koehl, Dirk Muller, Sven Peyer, Christian Schulte: Yield Improvement by Local Wiring Redundancy. ISQED 2006: 473-478

Coauthor Index

1	Markus Bühler	[1] [2]
2	John Goss	[3]
3	Nazmul Habib	[3]
4	Jason Hibbeler	[1] [2]
5	Rajiv V. Joshi	[3]
6	Rouwaida Kanj	[3]
7	Jürgen Koehl	[1] [2]
8	Robert McMahon	[3]
9	Dirk Muller	[1]
10	Sven Peyer	[1]
11	Michael Pronath	[2]
12	Andreas Ripp	[2]
13	Ulf Schlichtmann	[2]
14	Christian Schulte	[1]
15	R. Sommer	[2]

Colors in the list of coauthors

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page