M. Bialkowski

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2005

1 J. Yang, J. J. Kopanski, A. Postula, M. Bialkowski: Experimental investigation of the dielectric-semiconductor interface with scanning capacitance microscopy. Microelectronics Reliability 45(5-6): 887-890 (2005)

	2005
1		J. Yang, J. J. Kopanski, A. Postula, M. Bialkowski: Experimental investigation of the dielectric-semiconductor interface with scanning capacitance microscopy. Microelectronics Reliability 45(5-6): 887-890 (2005)

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