Naresh K. Bhatti

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2008

2 Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D. Blanton: Physically-Aware N-Detect Test Pattern Selection. DATE 2008: 634-639

2006

1 Naresh K. Bhatti, Ronald D. Blanton: Diagnostic Test Generation for Arbitrary Faults. ITC 2006: 1-9

	2008
2		Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D. Blanton: Physically-Aware N-Detect Test Pattern Selection. DATE 2008: 634-639
	2006
1		Naresh K. Bhatti, Ronald D. Blanton: Diagnostic Test Generation for Arbitrary Faults. ITC 2006: 1-9

Coauthor Index

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team —

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1	R. D. (Shawn) Blanton (Ronald D. Blanton)	[1] [2]
2	Yen-Tzu Lin	[2]
3	Osei Poku	[2]