 | 2012 |
| 30 |  | Shyam Kumar Devarakond,
Shreyas Sen,
Soumendu Bhattacharya,
Abhijit Chatterjee:
Concurrent Device/Specification Cause-Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures.
IEEE Design & Test of Computers 29(1): 48-58 (2012) |
| 2011 |
| 29 |  | Aritra Banerjee,
Vishwanath Natarajan,
Shreyas Sen,
Abhijit Chatterjee,
Ganesh Srinivasan,
Soumendu Bhattacharya:
Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation.
VLSI Design 2011: 274-279 |
| 2010 |
| 28 |  | Shyam Kumar Devarakond,
Shreyas Sen,
Soumendu Bhattacharya,
Abhijit Chatterjee:
Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures.
VTS 2010: 337-342 |
| 2009 |
| 27 |  | Abhijit Chatterjee,
Donghoon Han,
Vishwanath Natarajan,
Shyam Kumar Devarakond,
Shreyas Sen,
Hyun Choi,
Rajarajan Senguttuvan,
Soumendu Bhattacharya,
Abhilash Goyal,
Deuk Lee,
Madhavan Swaminathan:
Iterative built-in testing and tuning of mixed-signal/RF systems.
ICCD 2009: 319-326 |
| 26 |  | Rajarajan Senguttuvan,
Soumendu Bhattacharya,
Abhijit Chatterjee:
Efficient EVM Testing of Wireless OFDM Transceivers Using Null Carriers.
IEEE Trans. VLSI Syst. 17(6): 803-814 (2009) |
| 2008 |
| 25 |  | Rajarajan Senguttuvan,
Soumendu Bhattacharya,
Abhijit Chatterjee:
Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise.
VTS 2008: 175-180 |
| 24 |  | Achintya Halder,
Soumendu Bhattacharya,
Abhijit Chatterjee:
System-Level Specification Testing Of Wireless Transceivers.
IEEE Trans. VLSI Syst. 16(3): 263-276 (2008) |
| 2007 |
| 23 |  | Maryam Ashouei,
Soumendu Bhattacharya,
Abhijit Chatterjee:
Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors.
VTS 2007: 125-130 |
| 22 |  | Donghoon Han,
Soumendu Bhattacharya,
Abhijit Chatterjee:
Low-cost parametric test and diagnosis of RF systems using multi-tone response envelope detection.
IET Computers & Digital Techniques 1(3): 170-179 (2007) |
| 2006 |
| 21 |  | Donghoon Han,
Shalabh Goyal,
Soumendu Bhattacharya,
Abhijit Chatterjee:
Low Cost Parametric Failure Diagnosis of RF Transceivers.
European Test Symposium 2006: 205-212 |
| 20 |  | Maryam Ashouei,
Soumendu Bhattacharya,
Abhijit Chatterjee:
Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study.
European Test Symposium 2006: 35-42 |
| 19 |  | Soumendu Bhattacharya,
Vishwanath Natarajan,
Abhijit Chatterjee,
Sankar Nair:
Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms.
VLSI Design 2006: 729-733 |
| 18 |  | Vishwanath Natarajan,
Soumendu Bhattacharya,
Abhijit Chatterjee:
Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors.
VTS 2006: 192-199 |
| 17 |  | Maryam Ashouei,
Soumendu Bhattacharya,
Abhijit Chatterjee:
Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction.
VTS 2006: 208-213 |
| 16 |  | Soumendu Bhattacharya,
Abhijit Chatterjee:
A DFT Approach for Testing Embedded Systems Using DC Sensors.
IEEE Design & Test of Computers 23(6): 464-475 (2006) |
| 2005 |
| 15 |  | Donghoon Han,
Selim Sermet Akbay,
Soumendu Bhattacharya,
Abhijit Chatterjee,
William R. Eisenstadt:
On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST).
IOLTS 2005: 106-111 |
| 14 |  | Soumendu Bhattacharya,
Rajarajan Senguttuvan,
Abhijit Chatterjee:
Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF.
ITC 2005: 10 |
| 13 |  | Achintya Halder,
Soumendu Bhattacharya,
Ganesh Srinivasan,
Abhijit Chatterjee:
A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode.
VLSI Design 2005: 289-294 |
| 12 |  | Soumendu Bhattacharya,
Abhijit Chatterjee:
Production Test Methods for Measuring 'Out-of-Band' Interference of Ultra Wide Band (UWB) Devices.
VTS 2005: 137-142 |
| 11 |  | Soumendu Bhattacharya,
Abhijit Chatterjee:
Optimized wafer-probe and assembled package test design for analog circuits.
ACM Trans. Design Autom. Electr. Syst. 10(2): 303-329 (2005) |
| 10 |  | Soumendu Bhattacharya,
Achintya Halder,
Ganesh Srinivasan,
Abhijit Chatterjee:
Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications.
J. Electronic Testing 21(3): 323-339 (2005) |
| 2004 |
| 9 |  | Soumendu Bhattacharya,
Abhijit Chatterjee:
A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits.
Asian Test Symposium 2004: 68-73 |
| 8 |  | Ganesh Srinivasan,
Soumendu Bhattacharya,
Sasikumar Cherubal,
Abhijit Chatterjee:
Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit.
DATE 2004: 280-285 |
| 7 |  | Soumendu Bhattacharya,
Ganesh Srinivasan,
Sasikumar Cherubal,
Abhijit Chatterjee:
Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences.
DELTA 2004: 372-377 |
| 6 |  | Soumendu Bhattacharya,
Abhijit Chatterjee:
Use of Embedded Sensors for Built-In-Test of RF Circuits.
ITC 2004: 801-809 |
| 5 |  | Soumendu Bhattacharya,
Ganesh Srinivasan,
Sasikumar Cherubal,
Achintya Halder,
Abhijit Chatterjee:
System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams.
VTS 2004: 229-236 |
| 2003 |
| 4 |  | Achintya Halder,
Soumendu Bhattacharya,
Abhijit Chatterjee:
Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models.
ITC 2003: 665-673 |
| 3 |  | Soumendu Bhattacharya,
Abhijit Chatterjee:
High Coverage Analog Wafer-Probe Test Design and Co-optimization with Assembled-Package Test to Minimize Overall Test Cost.
VTS 2003: 89-100 |
| 2002 |
| 2 |  | Soumendu Bhattacharya,
Abhijit Chatterjee:
Constrained Specification-Based Test Stimulus Generation for Analog Circuits Using Nonlinear Performance Prediction Models.
DELTA 2002: 25-32 |
| 1993 |
| 1 |  | Abhijit Chatterjee,
P. P. Das,
Soumendu Bhattacharya:
Visualization in linear programming using parallel coordinates.
Pattern Recognition 26(11): 1725-1736 (1993) |