Sravan Kumar Bhaskarani

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2007

3 Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani: Built in Defect Prognosis for Embedded Memories. DDECS 2007: 167-172

2 Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani: GALS Based Shared Test Architecture for Embedded Memories. ISCAS 2007: 157-160

1 Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani: Low Area Adaptive Fail-Data Compression Methodology for Defect Classification and Production Phase Prognosis. ISVLSI 2007: 171-178

	2007
3		Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani: Built in Defect Prognosis for Embedded Memories. DDECS 2007: 167-172
2		Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani: GALS Based Shared Test Architecture for Embedded Memories. ISCAS 2007: 157-160
1		Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani: Low Area Adaptive Fail-Data Compression Methodology for Defect Classification and Production Phase Prognosis. ISVLSI 2007: 171-178

Coauthor Index

1 Prashant Dubey [1] [2] [3]

2 Akhil Garg [1] [2] [3]

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