G. P. Beyer

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2005

1 Zs. Tökei, Y.-L. Li, G. P. Beyer: Reliability challenges for copper low-k dielectrics and copper diffusion barriers. Microelectronics Reliability 45(9-11): 1436-1442 (2005)

	2005
1		Zs. Tökei, Y.-L. Li, G. P. Beyer: Reliability challenges for copper low-k dielectrics and copper diffusion barriers. Microelectronics Reliability 45(9-11): 1436-1442 (2005)

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