A. Beyer

	2001
1		B. Lanchava, P. Baumgartner, A. Martin, A. Beyer, E. Mueller: Oxide reliability: influence of interface roughness, structure layout, and depletion layer formation. Microelectronics Reliability 41(7): 1097-1100 (2001)

Coauthor Index

1	P. Baumgartner	[1]
2	B. Lanchava	[1]
3	A. Martin	[1]
4	E. Mueller	[1]

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