Vijay Bettada

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2003

1 Joel Grodstein, Dilip K. Bhavsar, Vijay Bettada, Richard A. Davies: Automatic Generation of Critical-Path Tests for a Partial-Scan Microprocessor. ICCD 2003: 180-186

	2003
1		Joel Grodstein, Dilip K. Bhavsar, Vijay Bettada, Richard A. Davies: Automatic Generation of Critical-Path Tests for a Partial-Scan Microprocessor. ICCD 2003: 180-186

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