E. Bertagnolli

	2005
1		Michael Nelhiebel, J. Wissenwasser, Thomas Detzel, A. Timmerer, E. Bertagnolli: Hydrogen-related influence of the metallization stack on characteristics and reliability of a trench gate oxide. Microelectronics Reliability 45(9-11): 1355-1359 (2005)

Coauthor Index

1	Thomas Detzel	[1]
2	Michael Nelhiebel	[1]
3	A. Timmerer	[1]
4	J. Wissenwasser	[1]

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