Y. Bert

	2011
1		Y. Joly, Laurent Lopez, Jean Michel Portal, Hassen Aziza, Jean-Luc Ogier, Y. Bert, F. Julien, Pascal Fornara: Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress. Microelectronics Reliability 51(9-11): 1561-1563 (2011)

Coauthor Index

1	Hassen Aziza	[1]
2	Pascal Fornara	[1]
3	Y. Joly	[1]
4	F. Julien	[1]
5	Laurent Lopez	[1]
6	Jean-Luc Ogier	[1]
7	Jean Michel Portal	[1]

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