Gennadi Bersuker

	2007
5		Chadwin D. Young, Dawei Heh, Arnost Neugroschel, Rino Choi, Byoung Hun Lee, Gennadi Bersuker: Electrical characterization and analysis techniques for the high-kappa era. Microelectronics Reliability 47(4-5): 479-488 (2007)
4		Arnost Neugroschel, Gennadi Bersuker, Rino Choi: Applications of DCIV method to NBTI characterization. Microelectronics Reliability 47(9-11): 1366-1372 (2007)
	2006
3		Gerald Lucovsky, H. Seo, L. B. Fleming, M. D. Ulrich, J. Lüning, Patrick Lysaght, Gennadi Bersuker: Intrinsic bonding defects in transition metal elemental oxides. Microelectronics Reliability 46(9-11): 1623-1628 (2006)
	2005
2		Chadwin D. Young, Gennadi Bersuker, Yuegang Zhao, Jeff J. Peterson, Joel Barnett, George A. Brown, Jang H. Sim, Rino Choi, Byoung Hun Lee, Peter Zeitzoff: Probing stress effects in HfO2 gate stacks with time dependent measurements. Microelectronics Reliability 45(5-6): 806-810 (2005)
	2001
1		Gennadi Bersuker, Yongjoo Jeon, Howard R. Huff: Degradation of thin oxides during electrical stress. Microelectronics Reliability 41(12): 1923-1931 (2001)

Coauthor Index

1	Joel Barnett	[2]
2	George A. Brown	[2]
3	Rino Choi	[2] [4] [5]
4	L. B. Fleming	[3]
5	Dawei Heh	[5]
6	Howard R. Huff	[1]
7	Yongjoo Jeon	[1]
8	Byoung Hun Lee	[2] [5]
9	Gerald Lucovsky	[3]
10	J. Lüning	[3]
11	Patrick Lysaght	[3]
12	Arnost Neugroschel	[4] [5]
13	Jeff J. Peterson	[2]
14	H. Seo	[3]
15	Jang H. Sim	[2]
16	M. D. Ulrich	[3]
17	Chadwin D. Young	[2] [5]
18	Peter Zeitzoff	[2]
19	Yuegang Zhao	[2]

Colors in the list of coauthors

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