Vincent Beroulle

	2012
24		Gilles Fritz, Vincent Beroulle, Oum-El-Kheir Aktouf, David Hély: Evaluation of a new RFID system performance monitoring approach. DATE 2012: 1439-1442
	2011
23		David Hély, Vincent Beroulle, Feng Lu, José Ramón García Oya: Towards an unified IP verification and robustness analysis platform. DDECS 2011: 53-58
22		Gilles Fritz, Boutheina Maaloul, Vincent Beroulle, Oum-El-Kheir Aktouf, David Hély: Read rate profile monitoring for defect detection in RFID Systems. RFID-TA 2011: 89-94
21		Gilles Fritz, Vincent Beroulle, Oum-El-Kheir Aktouf, Minh Duc Nguyen, David Hély: RFID System On-line Testing Based on the Evaluation of the Tags Read-Error-Rate. J. Electronic Testing 27(3): 267-276 (2011)
	2009
20		Xuan-Tu Tran, Yvain Thonnart, Jean Durupt, Vincent Beroulle, Chantal Robach: Design-for-test approach of an asynchronous network-on-chip architecture and its associated test pattern generation and application. IET Computers & Digital Techniques 3(5): 487-500 (2009)
	2008
19		Xuan-Tu Tran, Yvain Thonnart, Jean Durupt, Vincent Beroulle, Chantal Robach: A Design-for-Test Implementation of an Asynchronous Network-on-Chip Architecture and its Associated Test Pattern Generation and Application. NOCS 2008: 149-158
18		Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro: Decreasing Test Qualification Time in AMS and RF Systems. IEEE Design & Test of Computers 25(1): 29-37 (2008)
17		Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro: Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test. VLSI Design 2008: (2008)
	2007
16		Youssef Serrestou, Vincent Beroulle, Chantal Robach: Functional Verification of RTL Designs driven by Mutation Testing metrics. DSD 2007: 222-227
15		Xuan-Tu Tran, Jean Durupt, Yvain Thonnart, François Bertrand, Vincent Beroulle, Chantal Robach: Implementation of a Design-for-Test Architecture for Asynchronous Networks-on-Chip. NOCS 2007: 216
14		Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro: Qualification of behavioral level design validation for AMS & RF SoCs. VLSI-SoC 2007: 206-211
13		Youssef Serrestou, Vincent Beroulle, Chantal Robach: Impact of hardware emulation on the verification quality improvement. VLSI-SoC 2007: 218-223
12		Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre: Mutation Sampling Technique for the Generation of Structural Test Data CoRR abs/0710.4802: (2007)
	2006
11		Yves Joannon, Vincent Beroulle, Rami Khouri, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro: Behavioral Modeling of WCDMA Transceiver with VHDL-AMS Language. DDECS 2006: 113-118
10		Xuan-Tu Tran, Vincent Beroulle, Jean Durupt, Chantal Robach, François Bertrand: Design-for-Test of Asynchronous Networks-on-Chip. DDECS 2006: 163-167
9		Youssef Serrestou, Vincent Beroulle, Chantal Robach: How to Improve a Set of Design Validation Data by Using Mutation-based Test. DDECS 2006: 77-78
8		Xuan-Tu Tran, Jean Durupt, François Bertrand, Vincent Beroulle, Chantal Robach: A DFT Architecture for Asynchronous Networks-on-Chip. European Test Symposium 2006: 219-224
	2005
7		Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre: Mutation Sampling Technique for the Generation of Structural Test Data. DATE 2005: 1022-1023
	2004
6		Laurent Latorre, Vincent Beroulle, Pascal Nouet: Design of CMOS MEMS based on mechanical resonators using a RF simulation approach. IEEE Trans. on CAD of Integrated Circuits and Systems 23(6): 962-967 (2004)
	2002
5		Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet: On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems. DATE 2002: 1120
4		Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet: Evaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical Systems. VTS 2002: 439-444
	2001
3		Vincent Beroulle, Laurent Latorre, M. Dardalhon, C. Oudea, G. Perez, F. Pressecq, Pascal Nouet: Impact of Technology Spreading on MEMS design Robustness. VLSI-SOC 2001: 241-251
2		Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet: Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing. VLSI-SOC 2001: 461-472
1		Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet: Test and Testability of a Monolithic MEMS for Magnetic Field Sensing. J. Electronic Testing 17(5): 439-450 (2001)

Coauthor Index

1	Oum-El-Kheir Aktouf	[21] [22] [24]
2	François Bertrand	[8] [10] [15]
3	Yves Bertrand	[1] [2] [4] [5]
4	Jean-Louis Carbonéro	[11] [14] [17] [18]
5	M. Dardalhon	[3]
6	Jean Durupt	[8] [10] [15] [19] [20]
7	Marie-Lise Flottes	[7] [12]
8	Gilles Fritz	[21] [22] [24]
9	David Hély	[21] [22] [23] [24]
10	Yves Joannon	[11] [14] [17] [18]
11	Rami Khouri	[11]
12	Laurent Latorre	[1] [2] [3] [4] [5] [6]
13	Feng Lu	[23]
14	Boutheina Maaloul	[22]
15	Minh Duc Nguyen	[21]
16	Pascal Nouet	[1] [2] [3] [4] [5] [6]
17	C. Oudea	[3]
18	José Ramón García Oya	[23]
19	G. Perez	[3]
20	F. Pressecq	[3]
21	Chantal Robach	[7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20]
22	Bruno Rouzeyre	[7] [12]
23	Mathieu Scholivé	[7] [12]
24	Youssef Serrestou	[9] [13] [16]
25	Smail Tedjini	[11] [14] [17] [18]
26	Yvain Thonnart	[15] [19] [20]
27	Xuan-Tu Tran	[8] [10] [15] [19] [20]

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