Frank Berntsen

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2008

2 Sverre Wichlund, Frank Berntsen, Einar J. Aas: Scan Test Response Compaction Combined with Diagnosis Capabilities. J. Electronic Testing 24(1-3): 235-246 (2008)

2006

1 Sverre Wichlund, Frank Berntsen, Einar J. Aas: Reducing ATE Bandwidth and memory requirements: A diagnosis friendly scan test response compactor. DFT 2006: 119-127

	2008
2		Sverre Wichlund, Frank Berntsen, Einar J. Aas: Scan Test Response Compaction Combined with Diagnosis Capabilities. J. Electronic Testing 24(1-3): 235-246 (2008)
	2006
1		Sverre Wichlund, Frank Berntsen, Einar J. Aas: Reducing ATE Bandwidth and memory requirements: A diagnosis friendly scan test response compactor. DFT 2006: 119-127

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