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Joseph B. Bernstein Coauthor index pubzone.org

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DBLP keys2011
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBing Huang, Manuel Rodriguez, Ming Li, Joseph B. Bernstein, Carol Smidts: Hardware Error Likelihood Induced by the Operation of Software. IEEE Transactions on Reliability 60(3): 622-639 (2011)
2009
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLLiyu Yang, Joseph B. Bernstein, T. Koschmieder: Assessment of acceleration models used for BGA solder joint reliability studies. Microelectronics Reliability 49(12): 1546-1554 (2009)
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLLiyu Yang, Joseph B. Bernstein: Failure rate estimation of known failure mechanisms of electronic packages. Microelectronics Reliability 49(12): 1563-1572 (2009)
2006
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJoseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor: Electronic circuit reliability modeling. Microelectronics Reliability 46(12): 1957-1979 (2006)
2005
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLXiaojun Li, Bing Huang, J. Qin, X. Zhang, Michael Talmor, Z. Gur, Joseph B. Bernstein: Deep Submicron CMOS Integrated Circuit Reliability Simulation with SPICE. ISQED 2005: 382-389
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLXiaojun Li, Joerg D. Walter, Joseph B. Bernstein: Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature. ISQED 2005: 496-502
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBing Huang, Xiaojun Li, Ming Li, Joseph B. Bernstein, Carol Smidts: Study of the Impact of Hardware Fault on Software Reliability. ISSRE 2005: 63-72
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJohn S. Suehle, B. Zhu, Y. Chen, Joseph B. Bernstein: Detailed study and projection of hard breakdown evolution in ultra-thin gate oxides. Microelectronics Reliability 45(3-4): 419-426 (2005)
2004
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHu Huang, Joseph B. Bernstein, Martin Peckerar, Ji Luo: Combined Channel Segmentation and Buffer Insertion for Routability and Performance Improvement of Field. ICCD 2004: 490-495
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJi Luo, Joseph B. Bernstein, J. Ari Tuchman, Hu Huang, Kuan-Jung Chung, Anthony L. Wilson: A High Performance Radiation-Hard Field Programmable Analog Array . ISQED 2004: 522-527
2002
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLZhuo Gao, Ji Luo, Hu Huang, Wei Zhang, Joseph B. Bernstein: Reliable Laser Programmable Gate Array Technology. ISQED 2002: 252-256

Coauthor Index

1Y. Chen [4]
2Kuan-Jung Chung [2]
3Zhuo Gao [1]
4Z. Gur [7]
5Moshe Gurfinkel [8]
6Bing Huang [5] [7] [11]
7Hu Huang [1] [2] [3]
8T. Koschmieder [10]
9Ming Li [5] [11]
10Xiaojun Li [5] [6] [7] [8]
11Ji Luo [1] [2] [3]
12Martin Peckerar [3]
13J. Qin [7]
14Manuel Rodriguez [11]
15Yoram Shapira [8]
16Carol Smidts [5] [11]
17John S. Suehle [4]
18Michael Talmor [7] [8]
19J. Ari Tuchman [2]
20Joerg D. Walter [6]
21Jörg Walters [8]
22Anthony L. Wilson [2]
23Liyu Yang [9] [10]
24Wei Zhang [1]
25X. Zhang [7]
26B. Zhu [4]

Colors in the list of coauthors

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