S. Bernardini

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2004

1 S. Bernardini, Jean Michel Portal, Pascal Masson: A Tunneling Model for Gate Oxide Failure in Deep Sub-Micron Technology. DATE 2004: 1404-1405

	2004
1		S. Bernardini, Jean Michel Portal, Pascal Masson: A Tunneling Model for Gate Oxide Failure in Deep Sub-Micron Technology. DATE 2004: 1404-1405

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