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 | 2006 | |
|---|---|---|
| 6 |      | David I. Bergman, Gerard N. Stenbakken: Phase-plane-derived distortion modeling of a fast and accurate digitizing sampler. IEEE T. Instrumentation and Measurement 55(4): 1094-1100 (2006) |
| 2005 | ||
| 5 | | Donald R. Larson, Nicholas G. Paulter Jr., David I. Bergman: Pulse parameter dependence on transition occurrence instant and waveform epoch. IEEE T. Instrumentation and Measurement 54(4): 1520-1526 (2005) |
| 2004 | ||
| 4 | | David I. Bergman, Bryan C. Waltrip: Low thermal error sampling comparator for accurate settling measurements. ISCAS (1) 2004: 521-524 |
| 3 | | David I. Bergman: Dynamic error correction of a digitizer for time-domain metrology. IEEE T. Instrumentation and Measurement 53(5): 1384-1390 (2004) |
| 2003 | ||
| 2 | | David I. Bergman, Bryan C. Waltrip: A low-noise latching comparator probe for waveform sampling applications. IEEE T. Instrumentation and Measurement 52(4): 1107-1113 (2003) |
| 2002 | ||
| 1 | | David I. Bergman, Hans Engler: Improved IDDQ Testing with Empirical Linear Prediction. ITC 2002: 954-963 |
| 1 | Hans Engler | [1] |
| 2 | Donald R. Larson | [5] |
| 3 | Nicholas G. Paulter Jr. | [5] |
| 4 | Gerard N. Stenbakken | [6] |
| 5 | Bryan C. Waltrip | [2] [4] |
Colors in the list of coauthors
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