Timothy J. Bergfeld

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2000

1 Timothy J. Bergfeld, Dirk Niggemeyer, Elizabeth M. Rudnick: Diagnostic Testing of Embedded Memories Using BIST. DATE 2000: 305-309

	2000
1		Timothy J. Bergfeld, Dirk Niggemeyer, Elizabeth M. Rudnick: Diagnostic Testing of Embedded Memories Using BIST. DATE 2000: 305-309

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