John Berech

	2002
1		Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech: Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . ITC 2002: 1120-1129

Coauthor Index

1	Supatra Basu	[1]
2	Kenneth M. Butler	[1]
3	David J. Campbell	[1]
4	John Gatt	[1]
5	Sudheendra Phani Kumar	[1]
6	R. Raghuraman	[1]
7	Jayashree Saxena	[1]

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