Brady Benware

	2012
27		Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann: Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results. IEEE Design & Test of Computers 29(1): 8-18 (2012)
	2011
26		Xiaoxin Fan, Huaxing Tang, Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware: On Using Design Partitioning to Reduce Diagnosis Memory Footprint. Asian Test Symposium 2011: 219-225
25		Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer: Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. European Test Symposium 2011: 1-6
24		Manish Sharma, Avijit Dutta, Wu-Tung Cheng, Brady Benware, Mark Kassab: A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores. ITC 2011: 1-9
23		Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer: Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs. J. Electronic Testing 27(5): 599-609 (2011)
	2010
22		Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer: Diagnosis of failing scan cells through orthogonal response compaction. European Test Symposium 2010: 221-226
21		Yu Huang, Brady Benware, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen: Case study of scan chain diagnosis and PFA on a low yield wafer. ITC 2010: 818
20		Manish Sharma, Chris Schuermyer, Brady Benware: Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis. IEEE Design & Test of Computers 27(3): 54-61 (2010)
	2009
19		Ritesh P. Turakhia, Mark Ward, Sandeep Kumar Goel, Brady Benware: Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study. VTS 2009: 167-172
	2008
18		Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann: Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. ITC 2008: 1-9
	2007
17		Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware: Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. European Test Symposium 2007: 145-150
16		Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware: Silicon Evaluation of Static Alternative Fault Models. VTS 2007: 265-270
	2006
15		Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware: A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. ITC 2006: 1-10
14		Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware: Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Design & Test of Computers 23(2): 100-109 (2006)
13		Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer: Extracting Defect Density and Size Distributions from Product ICs. IEEE Design & Test of Computers 23(5): 390-400 (2006)
	2005
12		Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch: The value of statistical testing for quality, yield and test cost improvement. ITC 2005: 10
11		Joel Lurkins, D. Hill, Brady Benware: Case study: effectiveness of high-speed scan based feed forward voltage testing in reducing DPPM on a high volume ASIC. ITC 2005: 7
10		Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware: Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis. ITC 2005: 9
9		Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch: Defect Screening Using Independent Component Analysis on I_DDQ. VTS 2005: 427-432
	2004
8		Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski: Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC 2004: 1285-1294
7		Brady Benware: Achieving Sub 100 DPPM Defect Levels on VDSM and Nanometer ASICs. ITC 2004: 1418
6		Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler: In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212
5		Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware: Detection of Temperature Sensitive Defects Using ZTC. VTS 2004: 185-192
	2003
4		Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski: Impact of Multiple-Detect Test Patterns on Product Quality. ITC 2003: 1031-1040
3		Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning: Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. ITC 2003: 565-573
2		Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch: Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. VTS 2003: 39-46
1		Robert Madge, Brady Benware, W. Robert Daasch: Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. IEEE Design & Test of Computers 20(5): 46-53 (2003)

Coauthor Index

1	David Abercrombie	[18]
2	R. D. (Shawn) Blanton (Ronald D. Blanton)	[13]
3	Jason G. Brown	[13]
4	Yi-Jung Chang	[18]
5	Yuan-Shih Chen	[21]
6	Wu-Tung Cheng	[18] [21] [24] [26]
7	Kevin Cota	[3] [10]
8	W. Robert Daasch	[1] [2] [3] [5] [6] [9] [12] [14]
9	Avijit Dutta	[24]
10	Xiaoxin Fan	[26]
11	Sandeep Kumar Goel	[19]
12	Thomas Herrmann	[27]
13	D. Hill	[11]
14	Yu Huang	[21]
15	Jay Jahangiri	[16]
16	Mark Kassab	[8] [24]
17	Martin Keim	[8] [15] [16] [17] [18]
18	Prabhu Krishnamurthy	[4] [8]
19	Feng-Ming Kuo	[21]
20	Lincoln Lee	[18]
21	Reinhart Lin	[18]
22	Lei Ling	[18]
23	Ethan Long	[5]
24	Cam Lu	[2] [8]
25	Joel Lurkins	[11] [14]
26	Robert Madge	[1] [2] [3] [4] [5] [6] [8] [9] [10] [12]
27	Wojciech Maly	[13]
28	Albert Mann	[18]
29	Grzegorz Mrugalski	[22] [23] [25]
30	Jeffrey E. Nelson	[13]
31	L. Ning	[3]
32	Jewel Pangilinan	[16]
33	Artur Pogiel	[22] [23] [25]
34	Osei Poku	[13]
35	Janusz Rajski	[4] [8] [15] [16] [17] [22] [23] [25]
36	Sreenevasan Ranganathan	[4]
37	Sudhakar M. Reddy	[26]
38	Jens Ruffler	[6]
39	Chris Schuermyer	[3] [4] [6] [10] [13] [15] [16] [20] [27]
40	Thaddeus T. Shannon	[9]
41	Manish Sharma	[15] [17] [18] [20] [24] [27]
42	John Van Slyke	[8]
43	Jedrzej Solecki	[22] [23] [25]
44	Ting-Pu Tai	[18] [21]
45	Nagesh Tamarapalli	[4] [15]
46	Huaxing Tang	[15] [17] [18] [26]
47	Kun-Han Tsai	[4]
48	Ritesh P. Turakhia	[6] [9] [14] [19]
49	Jerzy Tyszer	[22] [23] [25]
50	Mark Ward	[12] [19]
51	Thomas Zanon	[13]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page