Ben Bennetts

R. G. Bennetts

	2007
18		Ben Bennetts: Electronics Design-for-Test: Past, Present and Future. European Test Symposium 2007: 4
	2006
17		Bill Eklow, Ben Bennetts: New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG). European Test Symposium 2006: 253-254
16		Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, J.-F. Cote: IEEE P1687: Toward Standardized Access of Embedded Instrumentation. ITC 2006: 1-8
	2005
15		Jeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts: IJTAG (internal JTAG): a step toward a DFT standard. ITC 2005: 8
	2004
14		Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts: Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. DATE 2004: 1184-1191
	2003
13		Monica Lobetti Bodoni, Ben Bennetts: Guest Editors' Introduction: Board Test. IEEE Design & Test of Computers 20(2): 5-7 (2003)
12		Erik Jan Marinissen, Bart Vermeulen, Henk D. L. Hollmann, Ben Bennetts: Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint. IEEE Design & Test of Computers 20(2): 8-18 (2003)
	1999
11		Tony Ambler, Ben Bennetts: Guest Editors' Introduction: Test and the Product Life Cycle. IEEE Design & Test of Computers 16(3): 20-22 (1999)
10		Mike Wondolowski, Ben Bennetts, Adam W. Ley: Boundary Scan: The Internet of Test. IEEE Design & Test of Computers 16(3): 34-43 (1999)
	1996
9		Bernd Könemann, Ben Bennetts, Najmi T. Jarwala, Benoit Nadeau-Dostie: Built-In Self-Test: Assuring System Integrity. IEEE Computer 29(11): 39-45 (1996)
	1995
8		Ben Bennetts: Guest Editor's Introduction. IEEE Design & Test of Computers 12(2): 6-7 (1995)
	1992
7		Ben Bennetts: Progress in DFT: A Personal View. ITC 1992: 19-20
6		Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker: Macro Testability: The Results of Production Device Applications. ITC 1992: 232-241
	1991
5		R. G. Bennetts: Scan Technology at Work. Fault-Tolerant Computing Systems 1991: 124-135
4		R. G. Bennetts, A. Osseyran: IEEE standard 1149.1-1990 on boundary scan: History, literature survey, and current status. J. Electronic Testing 2(1): 11-25 (1991)
	1990
3		Ben Bennetts: Test Technology in Europe. IEEE Design & Test of Computers 7(1): 6-8 (1990)
	1972
2		R. G. Bennetts: A realistic approach to detection test generation for combinatorial logic circuits. Comput. J. 15(3): 238-246 (1972)
	1971
1		Ben Bennetts, D. W. Lewin: Fault Diagnosis of Digital Systems - A Review. Comput. J. 14(2): 199-206 (1971)

Coauthor Index

1	Tony Ambler	[11]
2	Carl Barnhart	[14]
3	Frans P. M. Beenker	[6]
4	Monica Lobetti Bodoni	[13]
5	Dave Bonnett	[14]
6	Frank Bouwman	[6]
7	J.-F. Cote	[16]
8	Adam Cron	[14]
9	Alfred L. Crouch (Al Crouch)	[15] [16]
10	Jason Doege	[16]
11	Bill Eklow (William Eklow)	[14] [15] [16] [17]
12	Henk D. L. Hollmann	[12]
13	Neil Jacobson	[14]
14	Najmi T. Jarwala	[9]
15	Bernd Könemann	[9]
16	Mike Laisne	[16]
17	D. W. Lewin	[1]
18	Adam W. Ley	[10]
19	Erik Jan Marinissen	[12]
20	Benoit Nadeau-Dostie	[9]
21	Steven Oostdijk	[6]
22	Adam Osseiran	[14]
23	A. Osseyran	[4]
24	Ken Posse	[15] [16]
25	Jeff Rearick	[15] [16]
26	Mike Ricchetti	[16]
27	Rudi Stans	[6]
28	Stephen K. Sunter (Steve Sunter)	[14]
29	Bart Vermeulen	[12]
30	Mike Wondolowski	[10]

Colors in the list of coauthors

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