 | 2007 |
|---|
| 5 |       | José Luis Rosselló,
Carol de Benito,
Sebastiàn A. Bota,
Jaume Segura:
Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs.
DATE 2007: 1271-1276 |
| 2006 |
|---|
| 4 | | José Luis Rosselló,
Carol de Benito,
Sebastiàn A. Bota,
Jaume Segura:
Leakage Power Characterization Considering Process Variations.
PATMOS 2006: 66-74 |
| 3 | | Sebastiàn A. Bota,
José Luis Rosselló,
Carol de Benito,
Ali Keshavarzi,
Jaume Segura:
Impact of Thermal Gradients on Clock Skew and Testing.
IEEE Design & Test of Computers 23(5): 414-424 (2006) |
| 1996 |
|---|
| 2 | | Jaume Segura,
Carol de Benito,
A. Rubio,
Charles F. Hawkins:
A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors.
J. Electronic Testing 8(3): 229-239 (1996) |
| 1995 |
|---|
| 1 | | Jaume Segura,
Carol de Benito,
A. Rubio,
Charles F. Hawkins:
A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level.
ITC 1995: 544-551 |
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