H. Bender

	2001
1		C. Zhao, G. Roebben, H. Bender, E. Young, S. Haukka, M. Houssa, M. Naili, Stefan De Gendt, Marc M. Heyns, Omer Van der Biest: In situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction. Microelectronics Reliability 41(7): 995-998 (2001)

Coauthor Index

1	Omer Van der Biest	[1]
2	Stefan De Gendt	[1]
3	S. Haukka	[1]
4	Marc M. Heyns	[1]
5	M. Houssa	[1]
6	M. Naili	[1]
7	G. Roebben	[1]
8	E. Young	[1]
9	C. Zhao	[1]

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