B. Benbakhti

	2010
1		B. Benbakhti, J. S. Ayubi-Moak, Karol Kalna, D. Lin, G. Hellings, G. Brammertz, K. De Meyer, I. Thayne, Asen Asenov: Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures. Microelectronics Reliability 50(3): 360-364 (2010)

Coauthor Index

1	Asen Asenov	[1]
2	J. S. Ayubi-Moak	[1]
3	G. Brammertz	[1]
4	G. Hellings	[1]
5	Karol Kalna	[1]
6	D. Lin	[1]
7	K. De Meyer	[1]
8	I. Thayne	[1]

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