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| 2009 | ||
|---|---|---|
| 2 | Dan Alexandrescu, Anne-Lise Lhomme-Perrot, Erwin Schäfer, Cyrille Beltrando: Highs and lows of radiation testing. IOLTS 2009: 179 | |
| 2008 | ||
| 1 | Damien Leroy, Rémi Gaillard, Erwin Schäfer, Cyrille Beltrando, Shi-Jie Wen, Richard Wong: Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node. IOLTS 2008: 253-257 | |
| 1 | Dan Alexandrescu | [2] |
| 2 | Rémi Gaillard | [1] |
| 3 | Damien Leroy | [1] |
| 4 | Anne-Lise Lhomme-Perrot | [2] |
| 5 | Erwin Schäfer | [1] [2] |
| 6 | Shi-Jie Wen | [1] |
| 7 | Richard Wong | [1] |
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