Ian M. Bell

	2011
12		Thomas O. Myers, Ian M. Bell: Assessment of Microfluidic System Testability using Fault Simulation and Test Metrics. J. Electronic Testing 27(3): 363-373 (2011)
	2010
11		Likun Xia, Ian M. Bell, Antony J. Wilkinson: Automated Model Generation Algorithm for High-Level Fault Modeling. IEEE Trans. on CAD of Integrated Circuits and Systems 29(7): 1140-1145 (2010)
	2008
10		Likun Xia, Ian M. Bell, Antony J. Wilkinson: A novel approach for automated model generation. ISCAS 2008: 504-507
	2007
9		J. M. Gilbert, Ian M. Bell: The Effectiveness of Test in Controlling Quality Costs: A Conformability Analysis Based Approach. J. Electronic Testing 23(4): 293-307 (2007)
	2004
8		Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski: Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations. J. Electronic Testing 20(1): 11-23 (2004)
	2002
7		J. M. Gilbert, Ian M. Bell, D. R. Johnson: Design, Manufacture and Test - Quality Test Estimation. ISQED 2002: 200-205
	1997
6		Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski: Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations. DFT 1997: 100-109
5		Osama K. Abu-Shahla, Ian M. Bell: An On-Line Self-Testing Switched-Current Integrator. ITC 1997: 463-470
4		S. Yu, B. W. Jervis, Kevin R. Eckersall, Ian M. Bell: Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons. IEEE Trans. on CAD of Integrated Circuits and Systems 16(8): 930-935 (1997)
	1996
3		José Machado da Silva, José Silva Matos, Ian M. Bell, Gaynor E. Taylor: Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits. J. Electronic Testing 9(1-2): 75-88 (1996)
	1995
2		Ian M. Bell, Kevin R. Eckersall, Stephen J. Spinks, Gaynor E. Taylor: Fault Orientated Test and Fault Simulation of Mixed Signal Integrated Circuits. ISCAS 1995: 389-392
1		Geir E. Sæther, Chris Toumazou, Gaynor E. Taylor, Kevin R. Eckersall, Ian M. Bell: Concurrent Self Test of Switched Current Circuits Based on the S2I-Technique. ISCAS 1995: 841-844

Coauthor Index

1	Osama K. Abu-Shahla	[5]
2	Chris D. Chalk	[6] [8]
3	Kevin R. Eckersall	[1] [2] [4]
4	J. M. Gilbert	[7] [9]
5	B. W. Jervis	[4]
6	D. R. Johnson	[7]
7	José Silva Matos	[3]
8	Thomas O. Myers	[12]
9	Geir E. Sæther	[1]
10	José Machado da Silva	[3]
11	Stephen J. Spinks	[2] [6] [8]
12	Gaynor E. Taylor	[1] [2] [3]
13	Christofer Toumazou (Chris Toumazou)	[1]
14	Antony J. Wilkinson	[10] [11]
15	Likun Xia	[10] [11]
16	S. Yu	[4]
17	Mark Zwolinski	[6] [8]

Colors in the list of coauthors

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