V. V. Belkin

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2006

1 V. V. Belkin, S. G. Sharshunov: ISA Based Functional Test Generation with Application to Self-Test of RISC Processors. DDECS 2006: 75-76

	2006
1		V. V. Belkin, S. G. Sharshunov: ISA Based Functional Test Generation with Application to Self-Test of RISC Processors. DDECS 2006: 75-76

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