 | 2006 |
| 5 |  | Nandu Tendolkar,
Dawit Belete,
Bill Schwarz,
Bob Podnar,
Akshay Gupta,
Steve Karako,
Wu-Tung Cheng,
Alex Babin,
Kun-Han Tsai,
Nagesh Tamarapalli,
Greg Aldrich:
Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis.
ITC 2006: 1-9 |
| 2005 |
| 4 |  | Nandu Tendolkar,
Dawit Belete,
Ashutosh Razdan,
Hereman Reyes,
Bill Schwarz,
Marie Sullivan:
Test methodology for Freescale's high performance e600 core based on PowerPC/spl reg/ instruction set architecture.
ITC 2005: 9 |
| 2002 |
| 3 |  | Dawit Belete,
Ashutosh Razdan,
William Schwarz,
Rajesh Raina,
Christopher Hawkins,
Jeff Morehead:
Use of DFT Techniques In Speed Grading a 1GHz+ Microprocessor .
ITC 2002: 1111-1119 |
| 2 |  | Carol Pyron,
Rekha Bangalore,
Dawit Belete,
Jason Goertz,
Ashutosh Razdan,
Denise Younger:
Silicon Symptoms to Solutions: Applying Design for Debug Techniques.
ITC 2002: 664-672 |
| 2000 |
| 1 |  | Rajesh Raina,
Robert Bailey,
Dawit Belete,
Vikram Khosa,
Robert F. Molyneaux,
Javier Prado,
Ashutosh Razdan:
DFT advances in Motorola's Next-Generation 74xx PowerPCTM microprocessor.
ITC 2000: 131-140 |