C. C. Beh

	1984
2		David M. Wu, Charles E. Radke, C. C. Beh: Improve Yield and Quality Through Testability Analysis of VLSI Circuits. ITC 1984: 713-717
	1982
1		C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku: Do Stuck Fault Models Reflect Manufacturing Defects? ITC 1982: 35-42

Coauthor Index

1	K. H. Arya	[1]
2	Charles E. Radke	[1] [2]
3	E. Kofi Vida-Torku	[1]
4	David M. Wu	[2]

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