Richard W. Beegle

	1999
3		Richard W. Beegle, Robert W. Brocato, Ronald W. Grant: IMEMS accelerometer testing-test laboratory development and usage. ITC 1999: 338-347
	1997
2		Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins: Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. ITC 1997: 23-31
	1996
1		Alan W. Righter, Jerry M. Soden, Richard W. Beegle: High Resolution IDDQ Characterization and Testing - Practical Issues. ITC 1996: 259-268

Coauthor Index

1	Daniel L. Barton	[2]
2	Robert W. Brocato	[3]
3	Patrick L. Candelaria	[2]
4	Edward I. Cole Jr.	[2]
5	Ronald W. Grant	[3]
6	Charles F. Hawkins	[2]
7	Christopher L. Henderson	[2]
8	Alan W. Righter	[1]
9	Jerry M. Soden	[1] [2]
10	Paiboon Tangyunyong	[2]

Colors in the list of coauthors

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page