 | 2009 |
| 5 |  | V. Born,
M. Beck,
O. Bosholm,
D. Dalleau,
S. Glenz,
I. Haverkamp,
G. Kurz,
F. Lange,
A. Vest:
Extended metallization reliability testing: Combining standard wafer level with product tests to increase test sensitivity.
Microelectronics Reliability 49(1): 74-78 (2009) |
| 2006 |
| 4 |  | Jonghyun Lee,
Robert B. Ross,
S. Atchley,
M. Beck,
Rajeev Thakur:
MPI-IO/L: efficient remote I/O for MPI-IO via logistical networking.
IPDPS 2006 |
| 2002 |
| 3 |  | M. Beck,
S. Robins:
Explicit and Efficient Formulas for the Lattice Point Count in Rational Polygons Using Dedekind - Rademacher Sums.
Discrete & Computational Geometry 27(4): 443-459 (2002) |
| 1999 |
| 2 |  | M. Beck,
Prabhudev Konana,
Guangtian Liu,
Yanbin Liu,
Aloysius K. Mok:
Active and Real-Time Functionalities for Electronic Brokerage Design.
WECWIS 1999: 30-35 |
| 1997 |
| 1 |  | Ian C. Parmee,
M. Beck:
An Evolutionary, Agent-Assisted Strategy for Conceptual Design Space Decomposition.
Evolutionary Computing, AISB Workshop 1997: 275-286 |