Felix Beaudoin

	2007
28		Felix Beaudoin, Kevin Sanchez, Philippe Perdu: Dynamic laser stimulation techniques for advanced failure analysis and design debug applications. Microelectronics Reliability 47(9-11): 1517-1522 (2007)
	2006
27		F. Essely, F. Darracq, Vincent Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, André Touboul, Dean Lewis: Application of various optical techniques for ESD defect localization. Microelectronics Reliability 46(9-11): 1563-1568 (2006)
	2005
26		Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis: NIR laser stimulation for dynamic timing analysis. Microelectronics Reliability 45(9-11): 1459-1464 (2005)
25		Abdellatif Firiti, Felix Beaudoin, G. Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat: Impact of semiconductors material on IR Laser Stimulation signal. Microelectronics Reliability 45(9-11): 1465-1470 (2005)
24		C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier: Oxide charge measurements in EEPROM devices. Microelectronics Reliability 45(9-11): 1514-1519 (2005)
23		Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, J. M. Nicot, J. P. Roux, M. Otte: Dynamic Laser Stimulation Case Studies. Microelectronics Reliability 45(9-11): 1538-1543 (2005)
22		D. Briand, Felix Beaudoin, J. Courbat, N. F. de Rooij, Romain Desplats, Philippe Perdu: Failure analysis of micro-heating elements suspended on thin membranes. Microelectronics Reliability 45(9-11): 1786-1789 (2005)
	2003
21		Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted Lundquist, Ketan Shah: Fault Localization using Time Resolved Photon Emission and STIL Waveforms. ITC 2003: 254-263
20		T. Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Y. Danto: A physical approach on SCOBIC investigation in VLSI. Microelectronics Reliability 43(1): 173-177 (2003)
19		D. Trémouilles, G. Bertrand, M. Bafleur, Felix Beaudoin, Philippe Perdu, N. Guitard, L. Lescouzères: TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. Microelectronics Reliability 43(1): 71-79 (2003)
18		T. Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles: Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectronics Reliability 43(3): 439-444 (2003)
17		X. Lafontan, F. Pressecq, Felix Beaudoin, S. Rigo, M. Dardalhon, J.-L. Roux, P. Schmitt, J. Kuchenbecker, B. Baradat, D. Lellouchi: The advent of MEMS in space. Microelectronics Reliability 43(7): 1061-1083 (2003)
16		Abdellatif Firiti, D. Faujour, Gerald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis: Short defect characterization based on TCR parameter extraction. Microelectronics Reliability 43(9-11): 1563-1568 (2003)
15		M. Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis: Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. Microelectronics Reliability 43(9-11): 1639-1644 (2003)
14		Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari: Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. Microelectronics Reliability 43(9-11): 1663-1668 (2003)
13		Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, G. Haller, Vincent Pouget, Dean Lewis: From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectronics Reliability 43(9-11): 1681-1686 (2003)
12		Kevin Sanchez, Romain Desplats, G. Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu: Solar Cell Analysis with Light Emission and OBIC Techniques. Microelectronics Reliability 43(9-11): 1755-1760 (2003)
11		O. Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Ph. Descamps, Felix Beaudoin, L. Marina: Magnetic emission mapping for passive integrated components characterisation. Microelectronics Reliability 43(9-11): 1809-1814 (2003)
	2002
10		Patrick Mitran, Felix Beaudoin, Mourad N. El-Gamal: A 2.5 Gbit/s CMOS optical receiver frontend. ISCAS (5) 2002: 441-444
9		B. Domengès, P. Schwindenhammer, P. Poirier, Felix Beaudoin, Ph. Descamps: Comprehensive failure analysis of leakage faults in bipolar transistors. Microelectronics Reliability 42(9-11): 1449-1452 (2002)
8		Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement: Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. Microelectronics Reliability 42(9-11): 1581-1585 (2002)
7		Felix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, Dean Lewis: Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectronics Reliability 42(9-11): 1729-1734 (2002)
6		O. Crépel, Felix Beaudoin, L. Dantas de Morais, G. Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis: Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectronics Reliability 42(9-11): 1741-1746 (2002)
	2001
5		Dean Lewis, Vincent Pouget, T. Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu: Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectronics Reliability 41(9-10): 1471-1476 (2001)
4		Felix Beaudoin, X. Chauffleur, J. P. Fradin, Philippe Perdu, Romain Desplats, Dean Lewis: Modeling Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1477-1482 (2001)
3		Romain Desplats, Philippe Perdu, Felix Beaudoin: A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. Microelectronics Reliability 41(9-10): 1495-1499 (2001)
2		Romain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, Dean Lewis: Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1539-1544 (2001)
1		Felix Beaudoin, Philippe Perdu, Romain Desplats, S. Rigo, Dean Lewis: Silicon Thinning and Polishing on Packaged Devices. Microelectronics Reliability 41(9-10): 1557-1561 (2001)

Coauthor Index

1	M. Bafleur	[2] [18] [19] [27]
2	B. Baradat	[17]
3	T. Beauchêne	[5] [7] [18] [20]
4	G. Bertrand	[19]
5	Y. Bouttement	[11]
6	D. Briand	[22]
7	D. Carisetti	[8]
8	X. Chauffleur	[4]
9	J. C. Clement	[8]
10	J. Courbat	[22]
11	O. Crépel	[6] [11]
12	Yves Danto (Y. Danto)	[20]
13	M. Dardalhon	[17]
14	F. Darracq	[27]
15	Ph. Descamps	[9] [11]
16	Romain Desplats	[1] [2] [3] [4] [6] [7] [8] [11] [12] [13] [14] [15] [18] [21] [22] [23] [24] [26]
17	B. Domengès	[9]
18	Mourad N. El-Gamal	[10]
19	A. Eral	[14]
20	F. Essely	[27]
21	D. Faujour	[16]
22	Abdellatif Firiti	[13] [16] [25]
23	Pascal Fouillat	[5] [18] [20] [25]
24	J. P. Fradin	[4]
25	E. Frances	[15]
26	J.-L. Gauffier	[24]
27	Vincent Goubier	[16]
28	C. Goupil	[6] [11]
29	N. Guitard	[19] [27]
30	Gerald Haller (G. Haller)	[6] [7] [13] [16] [25]
31	J. Kuchenbecker	[17]
32	X. Lafontan	[17]
33	Hervé Lapuyade	[5]
34	D. Lellouchi	[17]
35	L. Lescouzères	[19]
36	Dean Lewis	[1] [2] [4] [5] [6] [7] [8] [13] [15] [16] [18] [20] [25] [26] [27]
37	Ted Lundquist	[21]
38	L. Marina	[11]
39	Moyra K. McManus	[14]
40	Patrick Mitran	[10]
41	J. M. Moragues	[16]
42	L. Dantas de Morais	[6]
43	C. De Nardi	[24]
44	Nagamani Nataraj	[21]
45	J. M. Nicot	[23]
46	M. Otte	[23]
47	Philippe Perdu	[1] [2] [3] [4] [5] [6] [7] [8] [11] [12] [13] [14] [15] [16] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28]
48	G. Perez	[12]
49	V. Pichetto	[12]
50	P. Poirier	[2] [9]
51	Vincent Pouget	[5] [13] [18] [20] [27]
52	F. Pressecq	[17]
53	M. Remmach	[15] [27]
54	S. Rigo	[1] [17]
55	N. F. de Rooij	[22]
56	J. P. Roux	[23] [26]
57	J.-L. Roux	[17]
58	Kevin Sanchez	[12] [23] [26] [28]
59	P. Schmitt	[17]
60	P. Schwindenhammer	[9]
61	Ketan Shah	[21]
62	Peilin Song	[14]
63	Franco Stellari	[14]
64	André Touboul	[5] [27]
65	D. Trémouilles (David Trémouilles)	[2] [18] [19]
66	Alan J. Weger	[14]
67	G. Woods	[26]

Colors in the list of coauthors

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