T. Beauchêne

	2003
5		T. Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Y. Danto: A physical approach on SCOBIC investigation in VLSI. Microelectronics Reliability 43(1): 173-177 (2003)
4		T. Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles: Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectronics Reliability 43(3): 439-444 (2003)
3		T. Beauchêne, D. Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat: Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectronics Reliability 43(9-11): 1577-1582 (2003)
	2002
2		Felix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, Dean Lewis: Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectronics Reliability 42(9-11): 1729-1734 (2002)
	2001
1		Dean Lewis, Vincent Pouget, T. Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu: Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectronics Reliability 41(9-10): 1471-1476 (2001)

Coauthor Index

1	M. Bafleur	[4]
2	Felix Beaudoin	[1] [2] [4] [5]
3	Yves Danto (Y. Danto)	[5]
4	Romain Desplats	[2] [4]
5	Pascal Fouillat	[1] [3] [4] [5]
6	Gerald Haller (G. Haller)	[2]
7	Hervé Lapuyade	[1]
8	Dean Lewis	[1] [2] [3] [4] [5]
9	Philippe Perdu	[1] [2] [3] [4] [5]
10	Vincent Pouget	[1] [4] [5]
11	André Touboul	[1]
12	D. Trémouilles (David Trémouilles)	[3] [4]

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