D. Bauza

	2005
1		D. Bauza, F. Rahmoune, R. Laqli, G. Ghibaudo: On the SILC mechanism in MOSFET's with ultrathin oxides. Microelectronics Reliability 45(5-6): 849-852 (2005)

Coauthor Index

1	Gérard Ghibaudo (G. Ghibaudo)	[1]
2	R. Laqli	[1]
3	F. Rahmoune	[1]

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