Robert C. Baumann

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2001

1 Robert C. Baumann, Eric B. Smith: Neutron-induced ¹⁰B fission as a major source of soft errors in high density SRAMs. Microelectronics Reliability 41(2): 211-218 (2001)

	2001
1		Robert C. Baumann, Eric B. Smith: Neutron-induced ¹⁰B fission as a major source of soft errors in high density SRAMs. Microelectronics Reliability 41(2): 211-218 (2001)

Coauthor Index

1 Eric B. Smith [1]

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