Anton J. Bauer

	2011
10		Martin Le-Huu, Holger Schmitt, Stefan Noll, Michael Grieb, Frederik F. Schrey, Anton J. Bauer, Lothar Frey, Heiner Ryssel: Investigation of the reliability of 4H-SiC MOS devices for high temperature applications. Microelectronics Reliability 51(8): 1346-1350 (2011)
	2007
9		Albena Paskaleva, Martin Lemberger, Anton J. Bauer: Polarity asymmetry of stress and charge trapping behavior of thin Hf- and Zr-silicate layers. Microelectronics Reliability 47(12): 2094-2099 (2007)
8		Martin Lemberger, A. Baunemann, Anton J. Bauer: Chemical vapor deposition of tantalum nitride films for metal gate application using TBTDET and novel single-source MOCVD precursors. Microelectronics Reliability 47(4-5): 635-639 (2007)
7		M. Rommel, Anton J. Bauer, Heiner Ryssel: Quantitative oxide charge determination by photocurrent analysis. Microelectronics Reliability 47(4-5): 673-677 (2007)
	2005
6		Martin Lemberger, Albena Paskaleva, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel: Electrical properties of hafnium silicate films obtained from a single-source MOCVD precursor. Microelectronics Reliability 45(5-6): 819-822 (2005)
5		Albena Paskaleva, Anton J. Bauer, Martin Lemberger: Conduction mechanisms and an evidence for phonon-assisted conduction process in thin high-k HfxTiySizO films. Microelectronics Reliability 45(7-8): 1124-1133 (2005)
	2003
4		Albena Paskaleva, Martin Lemberger, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel: Electrical characterization of zirconium silicate films obtained from novel MOCVD precursors. Microelectronics Reliability 43(8): 1253-1257 (2003)
	2001
3		S. Strobel, Anton J. Bauer, Matthias Beichele, Heiner Ryssel: Suppression of boron penetration through thin gate oxides by nitrogen implantation into the gate electrode in PMOS devices. Microelectronics Reliability 41(7): 1085-1088 (2001)
2		Matthias Beichele, Anton J. Bauer, Heiner Ryssel: Reliability of ultrathin nitrided oxides grown in low pressure N2O ambient. Microelectronics Reliability 41(7): 1089-1092 (2001)
1		M. P. M. Jank, Martin Lemberger, Anton J. Bauer, Lothar Frey, Heiner Ryssel: Electrical reliability aspects of through the gate implanted MOS structures with thin oxides. Microelectronics Reliability 41(7): 987-990 (2001)

Coauthor Index

1	A. Baunemann	[8]
2	Matthias Beichele	[2] [3]
3	Lothar Frey	[1] [4] [6] [10]
4	Michael Grieb	[10]
5	M. P. M. Jank	[1]
6	Martin Le-Huu	[10]
7	Martin Lemberger	[1] [4] [5] [6] [8] [9]
8	Stefan Noll	[10]
9	Albena Paskaleva	[4] [5] [6] [9]
10	M. Rommel	[7]
11	Heiner Ryssel	[1] [2] [3] [4] [6] [7] [10]
12	Holger Schmitt	[10]
13	Frederik F. Schrey	[10]
14	S. Strobel	[3]
15	Stefan Zürcher	[4] [6]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page