Kanad Basu

	2011
5		Kanad Basu, Prabhat Mishra, Priyadarsan Patra: Efficient combination of trace and scan signals for post silicon validation and debug. ITC 2011: 1-8
4		Kanad Basu, Prabhat Mishra: Efficient Trace Signal Selection for Post Silicon Validation and Debug. VLSI Design 2011: 352-357
3		Kanad Basu, Prabhat Mishra: Efficient trace data compression using statically selected dictionary. VTS 2011: 14-19
	2010
2		Kanad Basu, Prabhat Mishra: Test Data Compression Using Efficient Bitmask and Dictionary Selection Methods. IEEE Trans. VLSI Syst. 18(9): 1277-1286 (2010)
	2008
1		Kanad Basu, Prabhat Mishra: A novel test-data compression technique using application-aware bitmask and dictionary selection methods. ACM Great Lakes Symposium on VLSI 2008: 83-88

Coauthor Index

1	Prabhat Mishra	[1] [2] [3] [4] [5]
2	Priyadarsan Patra	[5]

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