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Magali Bastian Hage-Hassan
List of publications from the DBLP Bibliography Server - FAQ
| 2009 | ||
|---|---|---|
| 18 | Alexandre Ney, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin: A new design-for-test technique for SRAM core-cell stability faults. DATE 2009: 1344-1348 | |
| 17 | Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Analysis of Resistive-Open Defects in SRAM Sense Amplifiers. IEEE Trans. VLSI Syst. 17(10): 1556-1559 (2009) | |
| 2008 | ||
| 16 | Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin: A Design-for-Diagnosis Technique for SRAM Write Drivers. DATE 2008: 1480-1485 | |
| 15 | Michael Yap San Min, Philippe Maurine, Magali Bastian, Michel Robert: A Novel Dummy Bitline Driver for Read Margin Improvement in an eSRAM. DELTA 2008: 107-110 | |
| 14 | Michael Yap San Min, Philippe Maurine, Magali Bastian, Michel Robert: Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects. ISVLSI 2008: 310-315 | |
| 13 | Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs. ITC 2008: 1-10 | |
| 12 | Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin: An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. VTS 2008: 89-94 | |
| 2007 | ||
| 11 | Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Slow write driver faults in 65nm SRAM technology: analysis and March test solution. DATE 2007: 528-533 | |
| 10 | Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. European Test Symposium 2007: 97-104 | |
| 9 | Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs. VTS 2007: 361-368 | |
| 8 | Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. J. Electronic Testing 23(5): 435-444 (2007) | |
| 2006 | ||
| 7 | Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. DDECS 2006: 256-261 | |
| 6 | Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions. J. Electronic Testing 22(3): 287-296 (2006) | |
| 2005 | ||
| 5 | Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. DAC 2005: 857-862 | |
| 4 | Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan: Data Retention Fault in SRAM Memories: Analysis and Detection Procedures. VTS 2005: 183-188 | |
| 3 | Simone Borri, Magali Bastian Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel: Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. J. Electronic Testing 21(2): 169-179 (2005) | |
| 2 | Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. J. Electronic Testing 21(5): 551-561 (2005) | |
| 2004 | ||
| 1 | Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. Asian Test Symposium 2004: 266-271 | |
| 1 | Simone Borri | [1] [2] [3] [6] |
| 2 | Alberto Bosio | [13] |
| 3 | Luigi Dilillo | [1] [2] [3] [4] [5] [6] [7] [8] [13] [18] |
| 4 | Patrick Girard | [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [16] [17] [18] |
| 5 | Vincent Gouin | [12] [16] [18] |
| 6 | Christian Landrault | [9] [10] [11] |
| 7 | Philippe Maurine | [14] [15] |
| 8 | Michael Yap San Min | [14] [15] |
| 9 | Alexandre Ney | [9] [10] [11] [12] [13] [16] [17] [18] |
| 10 | Serge Pravossoudovitch | [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [16] [17] [18] |
| 11 | Michel Robert | [14] [15] |
| 12 | Arnaud Virazel | [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [16] [17] [18] |
Colors in the list of coauthors
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