L. Bary

	2007
3		Jinyu Ruan, Nicolas Nolhier, M. Bafleur, L. Bary, Fabio Coccetti, T. Lisec, Robert Plana: Electrostatic discharge failure analysis of capacitive RF MEMS switches. Microelectronics Reliability 47(9-11): 1818-1822 (2007)
	2005
2		S. Mellé, D. De Conto, L. Mazenq, David Dubuc, B. Poussard, C. Bordas, K. Grenier, L. Bary, O. Vendier, J. L. Muraro: Failure predictive model of capacitive RF-MEMS. Microelectronics Reliability 45(9-11): 1770-1775 (2005)
	2004
1		David Dubuc, M. Saddaoui, S. Mellé, F. Flourens, L. Rabbia, B. Ducarouge, K. Grenier, Patrick Pons, A. Boukabache, L. Bary: Smart MEMS concept for high secure RF and millimeterwave communications. Microelectronics Reliability 44(6): 899-907 (2004)

Coauthor Index

1	M. Bafleur	[3]
2	C. Bordas	[2]
3	A. Boukabache	[1]
4	Fabio Coccetti	[3]
5	D. De Conto	[2]
6	David Dubuc	[1] [2]
7	B. Ducarouge	[1]
8	F. Flourens	[1]
9	K. Grenier	[1] [2]
10	T. Lisec	[3]
11	L. Mazenq	[2]
12	S. Mellé	[1] [2]
13	J. L. Muraro	[2]
14	Nicolas Nolhier	[3]
15	Robert Plana	[3]
16	Patrick Pons	[1]
17	B. Poussard	[2]
18	L. Rabbia	[1]
19	Jinyu Ruan	[3]
20	M. Saddaoui	[1]
21	O. Vendier	[2]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page