Daniel L. Barton

	2001
2		Daniel L. Barton, Shigeru Nakajima, Massimo Vanzi: Editorial. Microelectronics Reliability 41(8): 1143-1144 (2001)
	1997
1		Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins: Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. ITC 1997: 23-31

Coauthor Index

1	Richard W. Beegle	[1]
2	Patrick L. Candelaria	[1]
3	Edward I. Cole Jr.	[1]
4	Charles F. Hawkins	[1]
5	Christopher L. Henderson	[1]
6	Shigeru Nakajima	[2]
7	Jerry M. Soden	[1]
8	Paiboon Tangyunyong	[1]
9	Massimo Vanzi	[2]

Colors in the list of coauthors

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