Olivier Barondeau

	2009
4		Frank-Uwe Faber, Matthias Beck, Markus Rudack, Olivier Barondeau, Thomas Rabenalt, Michael Gössel, Andreas Leininger: Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment. European Test Symposium 2009: 39-44
	2007
3		Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press: Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality CoRR abs/0710.4763: (2007)
	2005
2		Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press: Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality. DATE 2005: 56-61
1		Matthias Beck, Olivier Barondeau, Frank Poehl, Xijiang Lin, Ron Press: Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study. VTS 2005: 223-228

Coauthor Index

1	Matthias Beck	[1] [2] [3] [4]
2	Frank-Uwe Faber	[4]
3	Michael Gössel	[4]
4	Martin Kaibel	[2] [3]
5	Andreas Leininger	[4]
6	Xijiang Lin	[1] [2] [3]
7	Frank Poehl	[1] [2] [3]
8	Ron Press	[1] [2] [3]
9	Thomas Rabenalt	[4]
10	Markus Rudack	[4]

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