Hugh J. Barnaby

	2011
5		Nadia Rezzak, Michael L. Alles, Ronald D. Schrimpf, Sarah Kalemeris, Lloyd W. Massengill, John Sochacki, Hugh J. Barnaby: The sensitivity of radiation-induced leakage to STI topology and sidewall doping. Microelectronics Reliability 51(5): 889-894 (2011)
	2009
4		Sushmit Goswami, Jason Silver, Tino Copani, Wenjian Chen, Hugh J. Barnaby, Bert Vermeire, Sayfe Kiaei: A 14mW 5Gb/s CMOS TIA with gain-reuse regulated cascode compensation for parallel optical interconnects. ISSCC 2009: 100-101
3		Hugh J. Barnaby, Michael L. McLain, Ivan S. Esqueda, Xiao J. Chen: Modeling Ionizing Radiation Effects in Solid State Materials and CMOS Devices. IEEE Trans. on Circuits and Systems 56-I(8): 1870-1883 (2009)
	2008
2		Federico Faccio, Hugh J. Barnaby, Xiao J. Chen, Daniel M. Fleetwood, Laura Gonella, Michael L. McLain, Ronald D. Schrimpf: Total ionizing dose effects in shallow trench isolation oxides. Microelectronics Reliability 48(7): 1000-1007 (2008)
	2005
1		P. C. Adell, Ronald D. Schrimpf, C. R. Cirba, W. T. Holman, X. Zhu, Hugh J. Barnaby, O. Mion: Single event transient effects in a voltage reference. Microelectronics Reliability 45(2): 355-359 (2005)

Coauthor Index

1	P. C. Adell	[1]
2	Michael L. Alles	[5]
3	Wenjian Chen	[4]
4	Xiao J. Chen	[2] [3]
5	C. R. Cirba	[1]
6	Tino Copani	[4]
7	Ivan S. Esqueda	[3]
8	Federico Faccio	[2]
9	Daniel M. Fleetwood	[2]
10	Laura Gonella	[2]
11	Sushmit Goswami	[4]
12	W. T. Holman	[1]
13	Sarah Kalemeris	[5]
14	Sayfe Kiaei	[4]
15	Lloyd W. Massengill	[5]
16	Michael L. McLain	[2] [3]
17	O. Mion	[1]
18	Nadia Rezzak	[5]
19	Ronald D. Schrimpf	[1] [2] [5]
20	Jason Silver	[4]
21	John Sochacki	[5]
22	Bert Vermeire	[4]
23	X. Zhu	[1]

Colors in the list of coauthors

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page