 | 2011 |
| 16 |  | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
Functional fault models for non-scan sequential circuits.
Microelectronics Reliability 51(12): 2402-2411 (2011) |
| 2009 |
| 15 |  | Ramunas Kubiliunas,
Eduardas Bareisa:
A Formation Method of Flexible Learning Objects.
Informatics in Education 8(1): 49-68 (2009) |
| 14 |  | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
Functional delay test generation based on software prototype.
Microelectronics Reliability 49(12): 1578-1585 (2009) |
| 2008 |
| 13 |  | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
Development of Functional Delay Tests.
DSD 2008: 626-632 |
| 12 |  | Sarunas Packevicius,
Andrej Usaniov,
Eduardas Bareisa:
Platform Independent Unit Tests Generator.
SCSS (2) 2008: 177-179 |
| 11 |  | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
Test generation at the algorithm-level for gate-level fault coverage.
Microelectronics Reliability 48(7): 1093-1101 (2008) |
| 2007 |
| 10 |  | Sarunas Packevicius,
Andrej Usaniov,
Eduardas Bareisa:
Software testing using imprecise OCL constraints as oracles.
CompSysTech 2007: 121 |
| 9 |  | Eduardas Bareisa,
Eimutis Karciauskas,
Eugenijus Macikenas,
Kestutis Motiejunas:
Research and development of teaching software engineering processes.
CompSysTech 2007: 75 |
| 8 |  | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
Transition Faults Testing Based on Functional Delay Tests.
DDECS 2007: 371-376 |
| 7 |  | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
The Criteria of Functional Delay Test Quality Assessment.
DSD 2007: 207-214 |
| 6 |  | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
Functional Test Generation Based on Combined Random and Deterministic Search Methods.
Informatica, Lith. Acad. Sci. 18(1): 3-26 (2007) |
| 2006 |
| 5 |  | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
Transition Fault Test Reuse.
DSD 2006: 323-330 |
| 2005 |
| 4 |  | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
Functional Test Generation Remote Tool.
DSD 2005: 192-195 |
| 3 |  | Eduardas Bareisa,
Vacius Jusas,
Kestutis Motiejunas,
Rimantas Seinauskas:
The Realization-Independent Testing Based on the Black Box Fault Models.
Informatica, Lith. Acad. Sci. 16(1): 19-36 (2005) |
| 2004 |
| 2 |  | Juozas Adomavicius,
Eduardas Bareisa,
Vitalija Kersiene,
Vitolis Sekliuckis:
Modernization of Information Technologies Studies at University Level.
Informatics in Education 3(1): 3-18 (2004) |
| 2003 |
| 1 |  | Eduardas Bareisa,
Kestutis Motiejunas,
Rimantas Seinauskas:
Identifying Legal and Illegal States in Synchronous Sequential Circuits Using Test Generation.
Informatica, Lith. Acad. Sci. 14(2): 135-154 (2003) |