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Paul H. Bardell Coauthor index pubzone.org

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DBLP keys1992
16Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPaul H. Bardell: Calculating the effects of linear dependencies in m-sequences used as test stimuli. IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 83-86 (1992)
15Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPaul H. Bardell: Discrete logarithms a parallel pseudorandom pattern generator analysis method. J. Electronic Testing 3(1): 17-31 (1992)
14Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPaul H. Bardell: Primitive polynomials of degree 301 through 500. J. Electronic Testing 3(2): 175-176 (1992)
1991
13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPaul H. Bardell, Michael J. Lapointe: Production Experience with Built-In Self-Test in the IBM ES/9000 System. ITC 1991: 28-36
12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJacob Savir, Paul H. Bardell: Partitioning of polynomial tasks: test generation, an example. IEEE Trans. on CAD of Integrated Circuits and Systems 10(11): 1465-1468 (1991)
1990
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPaul H. Bardell: Analysis of cellular automata used as pseudorandom pattern generators. ITC 1990: 762-768
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPaul H. Bardell: Design considerations for Parallel pseudoRandom Pattern Generators. J. Electronic Testing 1(1): 73-87 (1990)
1989
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPaul H. Bardell: Calculating the Effects of Linear Dependencies in m-Sequences Used as Test Stimuli. ITC 1989: 252-256
1986
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPaul H. Bardell, William H. McAnney: Pseudorandom Arrays for Built-In Tests. IEEE Trans. Computers 35(7): 653-658 (1986)
1985
7no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPaul H. Bardell, William H. McAnney: Self-Test of Random Access Memories. ITC 1985: 352-355
1984
6no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLWilliam H. McAnney, Paul H. Bardell, V. P. Gupta: Random Testing for Stuck-At Storage Cells in an Embedded Memory. ITC 1984: 157-166
5no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPaul H. Bardell, William H. McAnney: Parallel Pseudorandom Sequences for Built-In Test. ITC 1984: 302-308
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJacob Savir, Gary S. Ditlow, Paul H. Bardell: Random Pattern Testability. IEEE Trans. Computers 33(1): 79-90 (1984)
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJacob Savir, Paul H. Bardell: On Random Pattern Test Length. IEEE Trans. Computers 33(6): 467-474 (1984)
1983
2no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJacob Savir, Paul H. Bardell: On Random Pattern Test Length. ITC 1983: 95-107
1982
1no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPaul H. Bardell, William H. McAnney: Self-Testing of Multichip Logic Modules. ITC 1982: 200-204

Coauthor Index

1Gary S. Ditlow [4]
2V. P. Gupta [6]
3Michael J. Lapointe [13]
4William H. McAnney [1] [5] [6] [7] [8]
5Jacob Savir [2] [3] [4] [12]

Colors in the list of coauthors

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