Mark R. Barber

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1990

3 Leslie Ackner, Mark R. Barber: Frequency enhancement of digital VLSI test systems. ITC 1990: 444-451

1986

2 Mark R. Barber, Walter I. Satre: Timing Measurements on CMOS VLSI Devices Designed to Drive TTL Loads. ITC 1986: 161-168

1983

1 Mark R. Barber: Subnanosecond Timing Measurements on MOS Devices Using Modern VLSI Test Systems. ITC 1983: 170-180

	1990
3		Leslie Ackner, Mark R. Barber: Frequency enhancement of digital VLSI test systems. ITC 1990: 444-451
	1986
2		Mark R. Barber, Walter I. Satre: Timing Measurements on CMOS VLSI Devices Designed to Drive TTL Loads. ITC 1986: 161-168
	1983
1		Mark R. Barber: Subnanosecond Timing Measurements on MOS Devices Using Modern VLSI Test Systems. ITC 1983: 170-180

Coauthor Index

1 Leslie Ackner [3]

2 Walter I. Satre [2]

Colors in the list of coauthors

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team —

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