Jash Banik

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1997

2 Anne Meixner, Jash Banik: Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. ITC 1997: 1043-1052

1996

1 Anne Meixner, Jash Banik: Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. ITC 1996: 309-318

	1997
2		Anne Meixner, Jash Banik: Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. ITC 1997: 1043-1052
	1996
1		Anne Meixner, Jash Banik: Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. ITC 1996: 309-318

Coauthor Index

1 Anne Meixner [1] [2]

Last update Sat May 26 04:23:17 2012 CET by the DBLP Team —

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